ARAÚJO, D. B.; http://lattes.cnpq.br/4533756082631526; ARAÚJO, Diego Buriti. (BrasilCentro de Engenharia Elétrica e Informática - CEEIUFCGUniversidade Federal de Campina Grande, 2010-07)
Looking through the test of Analog and Mixed systems, especially for the EVM problematic, it
was necessary studying the correlation between the system parameters coverage and the EVM. The
implementation and the application ...