GOMES, L. V.; http://lattes.cnpq.br/9663603094783048; GOMES, Luana de Vasconcelos. (BrasilCentro de Engenharia Elétrica e Informática - CEEIUFCGUniversidade Federal de Campina Grande, 2010-04)
The performances of the next generations of CMOS integrated circuits (technology 45
nm then 32 nm even 22 nm) will be mainly limited by the electric performances of the
networks of interconnections. These interconnections ...