ALENCAR, A. V.; http://lattes.cnpq.br/0848199094249449; ALENCAR, Allender Vilar de. (BrasilCentro de Engenharia Elétrica e Informática - CEEIUFCGUniversidade Federal de Campina Grande, 2019-12)
Currently, with the increase of the complexity of digital circuits and the decreasing
size of transistor, the digital circuits are more susceptible to faults. To obtain more
practicality in estimatation, precisely, of ...