DIAS, L. F.; http://lattes.cnpq.br/5319091439389514; DIAS, Luís Fonsêca.
Resumen:
The amount of data produced by RF applications has a tendency to increase
according to new technologies like the 5G set. The transmission and frequency rates
increase in proportion but hardware tools are not able to follow these changes, such as
analog-to-digital converters. This situation requires the development of intelligent
acquisition methods. In this context, this internship proposes to address the problematic
to test and validate a method of acquisition based on Compressive Sensing from a test
bench for actual data acquisition, compared to a simulation reference of this method. In a
laboratory centered on the design of silicon-integrated radio frequency electronic
systems, this internship aims to set up a dedicated test system with the choice of
instruments centered on the ASIC for test and the standard characteristics of the RF input
signals, as to validate the method in the development chain of an internal integrated
circuit.