MELO, T. G. J. T.; http://lattes.cnpq.br/0860878848946088; MELO, Telmo Gabriel de Jesus Torres de.
Abstract:
The analysis of parameters’s scope of microelectronics is of fundamental importance for
a correct modeling and study of the component and is not a trivial task. Usually, an index
analysis is done by the manufacturer, which is part of a series of pages, making it a timeconsuming
and expensive task. Due to, in this document are described the activities
developed by the student Telmo Gabriel de Jesus Torres de Melo in the Laboratory of
Metrology and Scientific Instrumentation with a workload of 180h. The file that existed
was a compilation of a list that facilitated the identification of the different types of
parameters that influence the CMOS when it is inserted in the topology BiCMOS 0.13μm.
This catalog focuses on key parameters that are amenable to computer simulation, making
it faster and more efficient. The lack for this catalog is solve the problem that the
laboratory collaborators had, due to the team don’t have the complete knowledgment of
the parameters necessary to run a simulation, resulting in a waste time.